ATPG for Design Errors-Is It Possible?

Design validation is essential to ensuring low cost design of reliable systems, and solutions for validation problems are coming from the manufacturing test community. The purpose of this panel is to summarize the current state of design validation research, and to outline important directions for future research in the area. The panel will include people from both industry and academia to give a balanced view of the current state of research, and achieve some mutual agreement between the two communities on future directions. Specific issues which will be addressed in this panel include, but are not limited to, the following: 1. The development of efficient design error models. 2. High speed, behavioral simulation and debugging techniques. 3. Automatic test generation targeting design errors. 4. Validation of systems containing intellectual property (IP) components. Proceedings of the 19th IEEE VLSI Test Symposium (VTS ’01) 1093-0167/01 $10.00 © 2001 IEEE